Molecular heterojunction morphology on rough substrate surfaces: component 
separation by Fourier subtraction

Turak, A.; Heidkamp, J.; Dosch, H.

doi:10.1088/0957-4484/28/285705

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Molecular heterojunction morphology on rough substrate surfaces: component separation by Fourier subtraction

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Turak, A.
Max Planck Society;

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Heidkamp, J.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Dosch, H.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Theoretische und Angewandte Physik;

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Turak, A., Heidkamp, J., & Dosch, H. (2010). Molecular heterojunction morphology on rough substrate surfaces: component separation by Fourier subtraction. Nanotechnology, 21(28): 285705. doi:10.1088/0957-4484/28/285705.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-3AC1-F

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