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Journal Article

Aspects regarding measurement of thickness of intergranular glassy films

MPS-Authors
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Bhattacharyya,  S.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Subramaniam,  A.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Koch,  C. T.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Rühle,  M.
Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Bhattacharyya, S., Subramaniam, A., Koch, C. T., & Rühle, M. (2006). Aspects regarding measurement of thickness of intergranular glassy films. Journal of Microscopy, 221, 46-62.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-46B9-4
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