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Determining thermodynamic and structural parameters of thin amorphous intergranular films by electron diffraction

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Koch,  C. T.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Bhattacharyya,  S.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Subramaniam,  A.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Rühle,  M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Koch, C. T., Bhattacharyya, S., Subramaniam, A., & Rühle, M. (2004). Determining thermodynamic and structural parameters of thin amorphous intergranular films by electron diffraction. In Proceedings of the 13th European Microscopy Congress, Vol. 2 (pp. 37-38). Belgian Society for Microscopy.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-49A8-1
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