Reliable optical characterization of e-beam evaporated TiO2 films deposited at 
different substrate temperatures

Amotchkina, Tatiana V.; Trubetskov, Michael K.; Tikhonravov, A.; Angelov, Ivan B.; Pervak, V.

doi:10.1364/AO.53.0000A8

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Reliable optical characterization of e-beam evaporated TiO₂ films deposited at different substrate temperatures

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Amotchkina, Tatiana V.
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

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Trubetskov, Michael K.
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

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Angelov, Ivan B.
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

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Amotchkina, T. V., Trubetskov, M. K., Tikhonravov, A., Angelov, I. B., & Pervak, V. (2013). Reliable optical characterization of e-beam evaporated TiO₂ films deposited at different substrate temperatures. Applied Optics, 53(4), A8-A15. doi:10.1364/AO.53.0000A8.

引用: https://hdl.handle.net/11858/00-001M-0000-0018-E435-C

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