Advanced applications of SEM-based electron diffraction techniques for the 
characterization of deformation structures of new steels

Zaefferer, S.

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Talk

Advanced applications of SEM-based electron diffraction techniques for the characterization of deformation structures of new steels

MPS-Authors

/persons/resource/persons125491

Zaefferer, S.
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Zaefferer, S. (2012). Advanced applications of SEM-based electron diffraction techniques for the characterization of deformation structures of new steels. Talk presented at E-MRS 2012, Strasbourg, France. Strasbourg, France. 2012-05-16.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-299B-6

Abstract

There is no abstract available