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Screening effects in probing the double layer by scanning electrochemical potential microscopy

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Hamou,  R. F.
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Erbe,  A.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Rohwerder,  M.
Christian Doppler Laboratory for Diffusion and Segregation Mechanisms, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Hamou, R. F., Erbe, A., & Rohwerder, M. (2009). Screening effects in probing the double layer by scanning electrochemical potential microscopy. Poster presented at Comsol European Conference October 2009, Milan, Italy.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-3EC7-1
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