English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Journal Article

Three Dimensional Orientation Microscopy Electron Backscatter Diffraction in a combined FIB/SEM

MPS-Authors
/persons/resource/persons125491

Zaefferer,  S.
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Wright, S. I., & Zaefferer, S. (2007). Three Dimensional Orientation Microscopy Electron Backscatter Diffraction in a combined FIB/SEM. GIT Imaging & Microscopy, 4, 40-41.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-563D-8
Abstract
There is no abstract available