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Three Dimensional Orientation Microscopy Electron Backscatter Diffraction in a combined FIB/SEM

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Zaefferer,  S.
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Wright, S. I., & Zaefferer, S. (2007). Three Dimensional Orientation Microscopy Electron Backscatter Diffraction in a combined FIB/SEM. GIT Imaging & Microscopy, 4, 40-41.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-563D-8
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