3D-orientation microscopy in a FIB-SEM: A new dimension of microstructure 
characterization

Zaefferer, S.

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3D-orientation microscopy in a FIB-SEM: A new dimension of microstructure characterization

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Zaefferer, S.
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer, S. (2006). 3D-orientation microscopy in a FIB-SEM: A new dimension of microstructure characterization. Talk presented at 13th Conference on Electron Backscatter Diffraction. Oxford, UK. 2006-04-04.

引用: https://hdl.handle.net/11858/00-001M-0000-0019-5A10-C

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