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In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale

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Kečkéš, J., Eiper, E., Martinschitz, K. J., Boesecke, P., Gindl, W., & Dehm, G. (2006). In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale. Advanced Engineering Materials, 8(11), 1084-1088. doi:10.1002/adem.200600156.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0024-570A-B
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