Item

Abstract

Using FTIR microscopy with polarized IR radiation on silicalite I single crystals fully loaded with p-xylene, the existence of an
ordered adsorbate could be proven for the
first time by IR spectroscopy.
By
analyzing
the
polarized absorption bands
the
orientation
of
the
p-xylene molecules relative to
the
host
structure
could
be
determined.
The
results
agree
well
with
structural
data
obtained
from
X-ray
diffraction experiments. These first results suggest
that
polarized
IR
microscopy
could
develop
into
a
powerful
tool
for
the
analysis
of
adsorbate structures, assisting
in
complete
structure
resolution
by
diffraction
techniques.