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Polarized Fourier Transform Infrared Microscopy as a Tool for Structural Analysis of Adsorbates in Molecular Sieves

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Citation

Schüth, F. (1992). Polarized Fourier Transform Infrared Microscopy as a Tool for Structural Analysis of Adsorbates in Molecular Sieves. The Journal of Physical Chemistry, 96(19), 7493-7496. doi:10.1021/j100198a003.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0024-3E6A-8
Abstract
Using FTIR microscopy with polarized IR radiation on silicalite I single crystals fully loaded with p-xylene, the existence of an
ordered adsorbate could be proven for the
first time by IR spectroscopy.
By
analyzing
the
polarized absorption bands
the
orientation
of
the
p-xylene molecules relative to
the
host
structure
could
be
determined.
The
results
agree
well
with
structural
data
obtained
from
X-ray
diffraction experiments. These first results suggest
that
polarized
IR
microscopy
could
develop
into
a
powerful
tool
for
the
analysis
of
adsorbate structures, assisting
in
complete
structure
resolution
by
diffraction
techniques.