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Quantitative Tiefenprofilierung durch XPS – Ein neuer Ansatz in der Oberflächenanalyse realer Materialien

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Merzlikin, S. V., Grünert, W., Strunskus, T., Witte, G., Wachs, I. E., Wöll, C. H., et al. (2007). Quantitative Tiefenprofilierung durch XPS – Ein neuer Ansatz in der Oberflächenanalyse realer Materialien. Talk presented at 49.Jahrestreffen Deutscher Katalytiker, DECHEMA, 2007. Weimar, Germany. 2007-03-14 - 2007-03-16.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0025-0878-B
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