Limits of ion-beam depth-profiling as used in diffusion studies on 
oxidation-sensitive materials

Ehmler, H.; Rehmet, A.; Rätzke, K.; Faupel, F.

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Limits of ion-beam depth-profiling as used in diffusion studies on oxidation-sensitive materials

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Ehmler, H.
Stellarator Scenario Development (E5), Max Planck Institute for Plasma Physics, Max Planck Society;

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Ehmler, H., Rehmet, A., Rätzke, K., & Faupel, F. (2002). Limits of ion-beam depth-profiling as used in diffusion studies on oxidation-sensitive materials. Defect Diffusion Forum, 203(2), 147-152.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-419D-4

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