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Conference Paper

Bayesian derivation of electron temperature profile using JET ECE diagnostics

MPS-Authors
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Schmuck,  S.
W7-X: Physics (PH), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons110611

Svensson,  J.
W7-X: Physics (PH), Max Planck Institute for Plasma Physics, Max Planck Society;
W7-X: Heating and CoDaC (HC), Max Planck Institute for Plasma Physics, Max Planck Society;

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P5.046.pdf
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Citation

Schmuck, S., Svensson, J., de la Luna, E., Figini, L., Johnson, T., Alper, B., et al. (2011). Bayesian derivation of electron temperature profile using JET ECE diagnostics. In A. Becoulet, T. Hoang, & U. Stroth (Eds.), 38th European Physical Society Conference on Plasma Physics. Contributed Papers. Geneva: European Physical Society.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0026-EB85-4
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