Quantitative reconstruction of the GDOES sputter depth profile of a 
monomolecular layer structure of thiourea on copper

Liu, Jun; Jian, W.; Wang, J. Y.; Hofmann, Siegfried; Shimizu, K.

doi:10.1016/j.apsusc.2015.01.065

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Quantitative reconstruction of the GDOES sputter depth profile of a monomolecular layer structure of thiourea on copper

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Hofmann, Siegfried
Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Liu, J., Jian, W., Wang, J. Y., Hofmann, S., & Shimizu, K. (2015). Quantitative reconstruction of the GDOES sputter depth profile of a monomolecular layer structure of thiourea on copper. Applied Surface Science, 331, 140-149. doi:10.1016/j.apsusc.2015.01.065.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0028-3332-1

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