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Structure of PtFe/Fe double-period multilayers investigated by X-ray diffraction, reflectivity, diffuse scattering and TEM

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Feydt,  J.
Electron Microscopy and Analytics, Center of Advanced European Studies and Research (caesar), Max Planck Society;

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Citation

Zotov, N., Feydt, J., Walther, T., & Ludwig, A. (2006). Structure of PtFe/Fe double-period multilayers investigated by X-ray diffraction, reflectivity, diffuse scattering and TEM. Applied Surface Science, 253(1), 128-132.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0028-6127-1
Abstract
Double-period [(Pt 1.7 nm/Fe 0.9 nm)(5)Fe(tFeA(2))](8) and [(Pt 1.8 nm/Fe 0.6 nM)(5)Fe(t(Fe2))](8) multilayers with different thickness t(Fe2) (between 0.23 and 4.32 nm) of the additional Fe layers, prepared by combinatorial sputter deposition, show differences in the mosaic spread and the vertical interfacial roughness when deposited on native or thermally oxidised Si wafers. Simulations of the wide-angle X-ray scattering intensities revealed the presence of interdiffusion in the (Pt/Fe)(5) bilayers and systematic variations of the grain sizes, perpendicular to the film surface, as well as the rms variations of the two superlattice periods with the total film thickness. A comparison of omega-rocking scans shows an increase of the correlated vertical roughness of the (Pt/Fe)5 multilayers with the total multilayer thickness. (c) 2006 Elsevier B.V. All rights reserved