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Role of Sub-Nanometer Dielectric Roughness on Microstructure and Charge Carrier Transport in alpha,omega-Dihexylsexithiophene Field-Effect Transistors

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Li,  Mengmeng
Dept. Müllen: Synthetic Chemistry, MPI for Polymer Research, Max Planck Society;

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Marszalek,  Tomasz
Dept. Müllen: Synthetic Chemistry, MPI for Polymer Research, Max Planck Society;

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Müllen,  Klaus
Dept. Müllen: Synthetic Chemistry, MPI for Polymer Research, Max Planck Society;

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Pisula,  Wojciech
Dept. Müllen: Synthetic Chemistry, MPI for Polymer Research, Max Planck Society;

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Li, M., Marszalek, T., Müllen, K., & Pisula, W. (2016). Role of Sub-Nanometer Dielectric Roughness on Microstructure and Charge Carrier Transport in alpha,omega-Dihexylsexithiophene Field-Effect Transistors. ACS Applied Materials and Interfaces, 8(25), 16200-16206. doi:10.1021/acsami.6b03233.


Cite as: http://hdl.handle.net/11858/00-001M-0000-002B-221E-9
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