Nanoscale Conductivity and Strain Field Mapping by IR and THz Near-Field 
Nanoscopy

Huber, A. J.; Keilmann, F.; Wittborn, J.; Aizpurua, J.; Ziegler, A.; Köck, T.; Hillenbrand, R.

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Talk

Nanoscale Conductivity and Strain Field Mapping by IR and THz Near-Field Nanoscopy

MPS-Authors

/persons/resource/persons109647

Köck, T.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Huber, A. J., Keilmann, F., Wittborn, J., Aizpurua, J., Ziegler, A., Köck, T., et al. (2009). Nanoscale Conductivity and Strain Field Mapping by IR and THz Near-Field Nanoscopy. Talk presented at International Conference on Frontiers of Characterization and Metrology for Nanoelectronics. Albany, NY. 2009-05-11 - 2009-05-14.

Cite as: https://hdl.handle.net/21.11116/0000-0000-228E-A

Abstract

There is no abstract available