Bayesian derivation of electron temperature profile using JET ECE diagnostics

Schmuck, S.; Svensson, J.; de la Luna, E.; Figini, L.; Johnson, T.; Alper, B.; Beurskens, M.; Fessey, J.; Gerbaud, T.; Sirinelli, A.; JET EFDA Contributors

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Poster

Bayesian derivation of electron temperature profile using JET ECE diagnostics

MPS-Authors

/persons/resource/persons110397

Schmuck, S.
W7-X: Physics (PH), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons110611

Svensson, J.
W7-X: Heating and CoDaC (HC), Max Planck Institute for Plasma Physics, Max Planck Society;
W7-X: Physics (PH), Max Planck Institute for Plasma Physics, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Schmuck, S., Svensson, J., de la Luna, E., Figini, L., Johnson, T., Alper, B., et al. (2011). Bayesian derivation of electron temperature profile using JET ECE diagnostics. Poster presented at 38th EPS Conference on Plasma Physics, Strasbourg.

Cite as: https://hdl.handle.net/21.11116/0000-0000-5E27-C

Abstract

There is no abstract available