日本語
 
Help Privacy Policy ポリシー/免責事項
  詳細検索ブラウズ

アイテム詳細


公開

学術論文

On the double peak structure of avalanche photodiode response to monoenergetic x-rays at various temperatures and bias voltages

MPS-Authors
/persons/resource/persons82516

Diepold,  Marc
Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons185466

Franke,  Beatrice
Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society;

Götzfried,  J.
Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons60535

Hänsch,  T. W.
Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons185464

Krauth,  Julian J.
Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society;

Mulhauser,  F.
Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons60722

Nebel,  Tobias
Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons60762

Pohl,  Randolf
Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society;

External Resource
There are no locators available
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
フルテキスト (公開)
公開されているフルテキストはありません
付随資料 (公開)
There is no public supplementary material available
引用

Monteiro, C. M. B., Amaro, F. D., Sousa, M. S., Abdou-Ahmed, M., Amaro, P., Biraben, F., Chen, T., Covita, D. S., Dax, A. J., Diepold, M., Fernandes, L. M. P., Franke, B., Galtier, S., Gouvea, A. L., Götzfried, J., Graf, T., Hänsch, T. W., Hildebrandt, M., Indelicato, P., Julien, L., Kirch, K., Knecht, A., Kottmann, F., Krauth, J. J., Liu, Y., Machado, J., Mulhauser, F., Naar, B., Nebel, T., Nez, F., Pohl, R., Santos, J. P., dos Santos, J. M. F., Schuhmann, K., Szabo, C. I., Taqqu, D., Veloso, J. F. C. A., & Antognini, A. (2018). On the double peak structure of avalanche photodiode response to monoenergetic x-rays at various temperatures and bias voltages. Journal of Instrumentation, 13:. doi:10.1088/1748-0221/13/01/C01033.


引用: https://hdl.handle.net/21.11116/0000-0000-E9CF-1
要旨
要旨はありません