High-contrast topography-free sample for near-field optical microscopy

Kalkbrenner, Thomas; Graf, M; Durkan, C; Mlynek, Jürgen; Sandoghdar, Vahid

doi:10.1063/1.125984

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

High-contrast topography-free sample for near-field optical microscopy

MPS-Authors

There are no MPG-Authors in the publication available

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Kalkbrenner, T., Graf, M., Durkan, C., Mlynek, J., & Sandoghdar, V. (2000). High-contrast topography-free sample for near-field optical microscopy. Applied Physics Letters, 76, 1206-1208. doi:10.1063/1.125984.

Cite as: https://hdl.handle.net/21.11116/0000-0002-9BD5-F

Abstract

The issue of topography artifacts has proven to play a very important role in interpreting images recorded in scanning near-field optical microscopy. We report on the fabrication and characterization of samples with essentially no topographic features while possessing very high optical contrast on the nanometric lateral scale. These samples open the door to routine and uncontroversial examinations of the resolution obtained in a scanning near-field optical microscope. (C) 2000 American Institute of Physics. [S0003-6951(00)04409-0].