Hofmann, S. Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society; Department of Physics, Shantou University, 243 Daxue Road, Shantou 515063, Guangdong, China;
Hofmann, S., Zhou, G., Kovac, J., Drev, S., Lian, S. Y., Lin, B., et al. (2019). Preferential sputtering effects in depth profiling of multilayers with SIMS, XPS and AES. Applied Surface Science, 483, 140-155. doi:10.1016/j.apsusc.2019.03.211.
