English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Journal Article

Towards fully integrated photonic displacement sensors

MPS-Authors
/persons/resource/persons216112

Bag,  Ankan
Interference Microscopy and Nanooptics, Emeritus Group Leuchs, Emeritus Groups, Max Planck Institute for the Science of Light, Max Planck Society;
Institute of Optics, Information and Photonics, Department of Physics, Friedrich-Alexander-University Erlangen-Nuremberg;

/persons/resource/persons201139

Neugebauer,  Martin
Interference Microscopy and Nanooptics, Emeritus Group Leuchs, Emeritus Groups, Max Planck Institute for the Science of Light, Max Planck Society;
Institute of Optics, Information and Photonics, Department of Physics, Friedrich-Alexander-University Erlangen-Nuremberg;

/persons/resource/persons238120

Mick,  Uwe
Interference Microscopy and Nanooptics, Emeritus Group Leuchs, Emeritus Groups, Max Planck Institute for the Science of Light, Max Planck Society;
Institute of Optics, Information and Photonics, Department of Physics, Friedrich-Alexander-University Erlangen-Nuremberg;

/persons/resource/persons201008

Banzer,  Peter
Interference Microscopy and Nanooptics, Emeritus Group Leuchs, Emeritus Groups, Max Planck Institute for the Science of Light, Max Planck Society;
Institute of Optics, Information and Photonics, Department of Physics, Friedrich-Alexander-University Erlangen-Nuremberg;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Supplementary Material (public)
There is no public supplementary material available
Citation

Bag, A., Neugebauer, M., Mick, U., Christiansen, S., Schulz, S. A., Banzer, P., et al. (2020). Towards fully integrated photonic displacement sensors. Nature Communications, 11: 2915. doi:10.1038/s41467-020-16739-y.


Cite as: https://hdl.handle.net/21.11116/0000-0004-B6AE-B
Abstract
The field of optical metrology with its high precision position, rotation and wavefront sensors represents the basis for lithography and high resolution microscopy. However, the on-chip integration - a task highly relevant for future nanotechnological devices - necessitates the reduction of the spatial footprint of sensing schemes by the deployment of novel concepts. A promising route towards this goal is predicated on the controllable directional emission of the fundamentally smallest emitters of light, i.e. dipoles, as an indicator. Here we realize an integrated displacement sensor based on the directional emission of Huygens dipoles excited in an individual dipolar antenna. The position of the antenna relative to the excitation field determines its directional coupling into a six-way crossing of photonic crystal waveguides. In our experimental study supported by theoretical calculations, we demonstrate the first prototype of an integrated displacement sensor with a standard deviation of the position accuracy below λ/300 at room temperature and ambient conditions.