X-ray reflectivity measurements at chromium-iridium tri-layer coatings

Stehlikova, Veronika; Döhring, Thorsten; Schäfer, Tobias; Stollenwerk, Manfred; Friedrich, Peter; Burwitz, Vadim; Hartner, Gisela; Bradshaw, Miranda; Liao, Yingyu; Pelliciari, Carlo

doi:10.1117/12.2530439

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X-ray reflectivity measurements at chromium-iridium tri-layer coatings

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Stehlikova, Veronika
High Energy Astrophysics, MPI for Extraterrestrial Physics, Max Planck Society;

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Friedrich, Peter
High Energy Astrophysics, MPI for Extraterrestrial Physics, Max Planck Society;

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引用

Stehlikova, V., Döhring, T., Schäfer, T., Stollenwerk, M., Friedrich, P., Burwitz, V., Hartner, G., Bradshaw, M., Liao, Y., & Pelliciari, C. (2019). X-ray reflectivity measurements at chromium-iridium tri-layer coatings. In S. L., O'Dell, & G., Pareschi (Eds.), Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX. doi:10.1117/12.2530439.

引用: https://hdl.handle.net/21.11116/0000-0006-668C-A

要旨

Studying astronomical objects in the X-ray regime, iridium-based layer systems are highly effective reflective materials for telescopes mirrors. Aschaffenburg University and the Czech Technical University in Prague jointly developed stress compensated chromium-iridium coatings. To overcome the disturbing reflectivity reduction of the iridium absorption edge around 2 keV photon energy and improve general reflectivity at lower incident energies, thin overcoat layers of chromium have been applied in addition. Corresponding measurements at several X-ray lines have been performed on these samples at the PANTER test facility of the Max-Planck Institute for extraterrestrial Physics. A part of the experimental results and their comparison with theoretical simulations are presented in this contribution.