X-Ray absorption spectroscopy: sensitive characterization of (model-) catalysts 
with the electron yield technique

Schedel-Niedrig, Thomas

doi:10.1007/s002160050990

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

X-Ray absorption spectroscopy: sensitive characterization of (model-) catalysts with the electron yield technique

MPS-Authors

/persons/resource/persons22063

Schedel-Niedrig, Thomas
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Schedel-Niedrig, T. (1998). X-Ray absorption spectroscopy: sensitive characterization of (model-) catalysts with the electron yield technique. Fresenius' Journal of Analytical Chemistry, 361, 680-682. doi:10.1007/s002160050990.

Cite as: https://hdl.handle.net/21.11116/0000-0007-6A2C-2

Abstract

Small chromium oxide particles (Cr₂O₃, CrO₂) supported on titanium dioxide and oxidized Ag(111) single crystals were investigated by X-ray absorption spectroscopy at the oxygen K-edge. The spectra were collected in the electron yield mode in order to increase the surface sensitivity. The shape of the sharp split White line (WL) in the O K-edges spectra depended strongly on the oxidation state of the chromium ions in the probed samples suggesting that the WL can be used as an indicator of different environments in the supported chromium oxide films. On the other hand, the O K-edges of the oxidized Ag(111) crystal indicated that the formation of the distinct oxygen species at the surface and in the near-surface region was accompanied by a different silver-to-oxygen covalent interaction.