Probing Depth of Total Electron-Yield XAS: Monte-Carlo Simulations of Auger 
Electron Trajectories

Schroeder, S. L. M.

doi:10.1051/jp4/1997147

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Probing Depth of Total Electron-Yield XAS: Monte-Carlo Simulations of Auger Electron Trajectories

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Schroeder, S. L. M.
Department of Chemistry, University of Cambridge;
Fritz Haber Institute, Max Planck Society;

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引用

Schroeder, S. L. M. (1997). Probing Depth of Total Electron-Yield XAS: Monte-Carlo Simulations of Auger Electron Trajectories. Journal de Physique IV, 7(C2), C2-153-C2-154. doi:10.1051/jp4/1997147.

引用: https://hdl.handle.net/21.11116/0000-0008-F919-4

要旨

The signal formation in total electron-yield (TEY) XAS has been modelled for keV absorption edges using a computationally fast Monte-Carlo algorithm for the simulation of the Auger electron trajectories. It is shown that a pure KLL Auger-yield model achieves good agreement with experimental data for the K-edge TEY attenuation in Al and Cu. Advantages of the Monte-Carlo simulation approach over empirical and analytical models for the TEY are pointed out.