Probing Depth of Total Electron-Yield XAS: Monte-Carlo Simulations of Auger 
Electron Trajectories

Schroeder, S. L. M.

doi:10.1051/jp4/1997147

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

Probing Depth of Total Electron-Yield XAS: Monte-Carlo Simulations of Auger Electron Trajectories

MPS-Authors

/persons/resource/persons263753

Schroeder, S. L. M.
Department of Chemistry, University of Cambridge;
Fritz Haber Institute, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Schroeder, S. L. M. (1997). Probing Depth of Total Electron-Yield XAS: Monte-Carlo Simulations of Auger Electron Trajectories. Journal de Physique IV, 7(C2), C2-153-C2-154. doi:10.1051/jp4/1997147.

Cite as: https://hdl.handle.net/21.11116/0000-0008-F919-4

Abstract

The signal formation in total electron-yield (TEY) XAS has been modelled for keV absorption edges using a computationally fast Monte-Carlo algorithm for the simulation of the Auger electron trajectories. It is shown that a pure KLL Auger-yield model achieves good agreement with experimental data for the K-edge TEY attenuation in Al and Cu. Advantages of the Monte-Carlo simulation approach over empirical and analytical models for the TEY are pointed out.