Can machine learning bring atom probe microscopy closer to analytical 
atomic-scale tomography

Gault, Baptiste

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Talk

Can machine learning bring atom probe microscopy closer to analytical atomic-scale tomography

MPS-Authors

/persons/resource/persons185411

Gault, Baptiste
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Imperial College, Royal School of Mines, Department of Materials, London, SW7 2AZ, UK;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Gault, B. (2019). Can machine learning bring atom probe microscopy closer to analytical atomic-scale tomography. Talk presented at 12th International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC 19). Kyoto, Japan. 2019-10-20 - 2019-10-25.

Cite as: https://hdl.handle.net/21.11116/0000-0009-29AE-6

Abstract

There is no abstract available