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Hopping conductivity in heavily doped n-type GaAs layers in the quantum Hall effect regime

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Murzin,  S. S.
High Magnetic Field Laboratory, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Weiss,  M.
High Magnetic Field Laboratory, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Jansen,  A. G. M.
High Magnetic Field Laboratory, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Eberl,  K.
Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Murzin, S. S., Weiss, M., Jansen, A. G. M., & Eberl, K. (2001). Hopping conductivity in heavily doped n-type GaAs layers in the quantum Hall effect regime. Physical Review B, 64(23): 233309.


Cite as: https://hdl.handle.net/21.11116/0000-000E-E51D-0
Abstract
We investigate the magnetoresistance of epitaxially grown,
heavily doped n-type GaAs layers with thickness (40-50 nm)
larger than the electronic mean free path (23 nm). The
temperature dependence of the dissipative resistance R-xx in
the quantum Hall effect regime can be well described by a
hopping law (R-xx proportional to exp{-(T-0/T)(p)}) with p
approximate to0.6. We discuss this result in terms of variable
range hopping in a Coulomb gap together with a dependence of
the electron localization length on the energy in the gap. The
value of the exponent p greater than or equal to0.5 shows that
electron-electron interactions have to be taken into account in
order to explain the occurrence of the quantum Hall effect in
these samples, which have a three-dimensional single electron
density of states.