Aberration-Corrected Scanning Transmission Electron Microscopy of La2CuO4-based 
Superconducting Interfaces at the Stuttgart Center for Electron Microscopy

Suyolcu, Y. E.; Wang, Y.; Baiutti, F.; Sigle, W:; Cristiani, G.; Gregori, G.; Logvenov, G.; Maier, J.; van Aken, P. A.

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Aberration-Corrected Scanning Transmission Electron Microscopy of La₂CuO₄-based Superconducting Interfaces at the Stuttgart Center for Electron Microscopy

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Wang, Y.
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

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Cristiani, G.
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;

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Gregori, G.
Department Physical Chemistry of Solids (Joachim Maier), Max Planck Institute for Solid State Research, Max Planck Society;

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Logvenov, G.
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;

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Maier, J.
Department Physical Chemistry of Solids (Joachim Maier), Max Planck Institute for Solid State Research, Max Planck Society;

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van Aken, P. A.
Scientific Facility Stuttgart Center for Electron Microscopy (Peter A. van Aken), Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Suyolcu, Y. E., Wang, Y., Baiutti, F., Sigle, W., Cristiani, G., Gregori, G., et al. (2018). Aberration-Corrected Scanning Transmission Electron Microscopy of La₂CuO₄-based Superconducting Interfaces at the Stuttgart Center for Electron Microscopy. JEOL News, 53, 8-17.

Cite as: https://hdl.handle.net/21.11116/0000-000E-D442-8

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