A new setup for high resolution fast X-ray reflectivity data acquisition

Lippmann, M.; Buffet, A.; Pflaum, K.; Ehnes, A.; Ciobanu, A.; Seeck, O.

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A new setup for high resolution fast X-ray reflectivity data acquisition

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Pflaum, K.
Max Planck Society;

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Lippmann, M., Buffet, A., Pflaum, K., Ehnes, A., Ciobanu, A., & Seeck, O. (2016). A new setup for high resolution fast X-ray reflectivity data acquisition. Review of Scientific Instruments, 87(11): 113904.

Cite as: https://hdl.handle.net/21.11116/0000-000E-D1A8-8

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