Element Specific Monolayer Depth Profiling

Macke, S.; Radi, A.; Hamann-Borrero, J. E.; Verna, A.; Bluschke, M.; Brück, S.; Goering, E.; Sutarto, R.; He, F.; Cristiani, G.; Wu, M.; Benckiser, E.; Habermeier, H.-U.; Logvenov, G.; Gauquelin, N.; Botton, G. A.; Kajdos, A. P.; Stemmer, S.; Sawatzky, G. A.; Haverkort, M. W.; Keimer, B.; Hinkov, V.

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Element Specific Monolayer Depth Profiling

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Cristiani, G.
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;

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Habermeier, H.-U.
Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society;
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;
Department Physical Chemistry of Solids (Joachim Maier), Max Planck Institute for Solid State Research, Max Planck Society;

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Logvenov, G.
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;

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Sawatzky, G. A.
External Scientific Members, Max Planck Institute for Solid State Research, Max Planck Society;
Miscellaneous, Max Planck Institute for Solid State Research, Max Planck Society;

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Keimer, B.
Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society;

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Hinkov, V.
Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Macke, S., Radi, A., Hamann-Borrero, J. E., Verna, A., Bluschke, M., Brück, S., et al. (2014). Element Specific Monolayer Depth Profiling. Advanced Materials, 26(38), 6554-6559.

Cite as: https://hdl.handle.net/21.11116/0000-000E-C954-1

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