Towards precise defect control in layered oxide structures by using oxide 
molecular beam epitaxy

Baiutti, F.; Christiani, G.; Logvenov, G.

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Towards precise defect control in layered oxide structures by using oxide molecular beam epitaxy

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Logvenov, G.
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;

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Baiutti, F., Christiani, G., & Logvenov, G. (2014). Towards precise defect control in layered oxide structures by using oxide molecular beam epitaxy. Beilstein Journal of Nanotechnology, 5, 596-602.

Cite as: https://hdl.handle.net/21.11116/0000-000E-C8A0-B

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