A stiff scanning tunneling microscopy head for measurement at low temperatures 
and in high magnetic fields

White, S. C.; Singh, U. R.; Wahl, P.

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

A stiff scanning tunneling microscopy head for measurement at low temperatures and in high magnetic fields

MPS-Authors

/persons/resource/persons280632

Wahl, P.
Former Research Groups, Max Planck Institute for Solid State Research, Max Planck Society;
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

White, S. C., Singh, U. R., & Wahl, P. (2011). A stiff scanning tunneling microscopy head for measurement at low temperatures and in high magnetic fields. Review of Scientific Instruments, 82(11): 113708.

Cite as: https://hdl.handle.net/21.11116/0000-000E-C0DB-2

Abstract

We have developed a measurement head for scanning tunneling microscopy (STM) and specifically for spectroscopic imaging STM which is optimized for high mechanical stiffness and good thermal conductivity by choice of material. The main components of the microscope head are made of sapphire. Sapphire has been chosen from several competing possibilities based on finite element modeling of the fundamental vibrational modes of the body. We demonstrate operation of the STM head in topographic imaging and tunneling spectroscopy at temperatures down to below 2 K. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3663611].