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On-chip Si/SiOx microtube refractometer

MPS-Authors
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Kiravittaya,  S.
Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society;

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Rastelli,  A.
Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society;
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

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Songmuang,  R.
Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society;

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Thurmer,  D. J.
Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society;

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Benyoucef,  M.
Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society;

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Schmidt,  O. G.
Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society;
Scientific Facility Nanostructuring Lab (Jürgen Weis), Max Planck Institute for Solid State Research, Max Planck Society;
Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Bernardi, A., Kiravittaya, S., Rastelli, A., Songmuang, R., Thurmer, D. J., Benyoucef, M., et al. (2008). On-chip Si/SiOx microtube refractometer. Applied Physics Letters, 93(9): 094106.


Cite as: https://hdl.handle.net/21.11116/0000-000E-AE4B-B
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