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Journal Article

Assessing Charge Carrier Trapping in Silicon Nanowires Using Picosecond Conductivity Measurements

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Bonn,  Mischa
MPI for Polymer Research, Max Planck Society;
Dept. Bonn: Molecular Spectroscopy, MPI for Polymer Research, Max Planck Society;

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Citation

Ulbricht, R., Kurstjens, R., & Bonn, M. (2012). Assessing Charge Carrier Trapping in Silicon Nanowires Using Picosecond Conductivity Measurements. Nano Letters, 12(7), 3821-3827.


Cite as: https://hdl.handle.net/11858/00-001M-0000-000E-797C-9
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