Erbe, A. Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Erbe, A. (2012). Thin Film Metrology. Talk presented at Seminar "Thin Film Metrology" (together with SENTECH Instruments). MPIE, Düsseldorf, Germany. 2012-03-01 - 2012-03-01.