Thermal x-ray diffraction and near-field phase contrast imaging

Li, Z.; Classen, A.; Peng, T.; Medvedev, N.; Wang, F.; Chapman, H. N.; Shih, Y.

doi:10.1209/0295-5075/120/16003

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Journal Article

Thermal x-ray diffraction and near-field phase contrast imaging

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Li, Z.
SLAC National Accelerator Laboratory;
Center for Free-Electron Laser Science, DESY;
Miller Group, Atomically Resolved Dynamics Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;

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https://dx.doi.org/10.1209/0295-5075/120/16003
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https://arxiv.org/abs/1606.03517
(Preprint)

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1606.03517.pdf
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Citation

Li, Z., Classen, A., Peng, T., Medvedev, N., Wang, F., Chapman, H. N., et al. (2017). Thermal x-ray diffraction and near-field phase contrast imaging. EPL, 120(1): 16003. doi:10.1209/0295-5075/120/16003.

Cite as: https://hdl.handle.net/21.11116/0000-0001-A432-D

Abstract

Using higher-order coherence of thermal light sources, the resolution power of standard x-ray imaging techniques can be enhanced. In this work, we applied the higher-order measurement to far-field x-ray diffraction and near-field phase contrast imaging (PCI), in order to achieve superresolution in x-ray diffraction and obtain enhanced intensity contrast in PCI. The cost of implementing such schemes is minimal compared to the methods that achieve similar effects by using entangled x-ray photon pairs.