Characterization of scintillator screens under irradiation of low energy 133Cs 
ions

Toledo-Garrido, J. J.; Galdon-Quiroga, J.; Viezzer, E.; Birkenmeier, G.; Olevskaia, V.; Balden, M.; Garcia-Lopez, J.; Jimenez-Ramos, M. C.; Rodriguez-Ramos, M.; Anda, G.; Videla-Trevin, M.; Garcia-Munoz, M.; ASDEX Upgrade Team, Max Planck Institute for Plasma Physics, Max Planck Society

doi:10.1088/1748-0221/17/02/P02026

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Characterization of scintillator screens under irradiation of low energy ¹³³Cs ions

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Galdon-Quiroga, J.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;
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Viezzer, E.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;
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Birkenmeier, G.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;
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Balden, M.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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https://doi.org/10.1088/1748-0221/17/02/P02026
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Toledo-Garrido, J. J., Galdon-Quiroga, J., Viezzer, E., Birkenmeier, G., Olevskaia, V., Balden, M., et al. (2022). Characterization of scintillator screens under irradiation of low energy ¹³³Cs ions. Journal of Instrumentation, 17: P02026. doi:10.1088/1748-0221/17/02/P02026.

Cite as: https://hdl.handle.net/21.11116/0000-000A-03CD-C

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