Charge transport and magnetization profile at the interface between the 
correlated metal CaRuO3 and the antiferromagnetic insulator CaMnO3

Freeland, J. W.; Chakhalian, J.; Boris, A. V.; Tonnerre, J. M.; Kavich, J. J.; Yordanov, P.; Grenier, S.; Zschack, P.; Karapetrova, E.; Popovich, P.; Lee, H. N.; Keimer, B.

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Charge transport and magnetization profile at the interface between the correlated metal CaRuO₃ and the antiferromagnetic insulator CaMnO₃

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Chakhalian, J.
Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society;

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Boris, A. V.
Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society;

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Yordanov, P.
Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society;
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;

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Keimer, B.
Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Freeland, J. W., Chakhalian, J., Boris, A. V., Tonnerre, J. M., Kavich, J. J., Yordanov, P., et al. (2010). Charge transport and magnetization profile at the interface between the correlated metal CaRuO₃ and the antiferromagnetic insulator CaMnO₃. Physical Review B, 81(9): 094414.

Cite as: https://hdl.handle.net/21.11116/0000-000E-BF1F-A

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