Tungsten oxide thin films probed by depth-resolved positron annihilation 
spectroscopy

Burwitz, V. V.; Kärcher, A.; Mathes, L.; Book, A.; Paul, N.; Schwarz-Selinger, T.; Butterling, M.; Hirschmann, E.; Liedke, M. O.; Wagner, A.; Unsal, E.; Cuniberti, G.; Hugenschmidt, C.

doi:10.1103/PhysRevB.111.054114

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Tungsten oxide thin films probed by depth-resolved positron annihilation spectroscopy

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Schwarz-Selinger, T.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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https://doi.org/10.1103/PhysRevB.111.054114
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Burwitz, V. V., Kärcher, A., Mathes, L., Book, A., Paul, N., Schwarz-Selinger, T., et al. (2025). Tungsten oxide thin films probed by depth-resolved positron annihilation spectroscopy. Physical Review E, 111: 054114. doi:10.1103/PhysRevB.111.054114.

Cite as: https://hdl.handle.net/21.11116/0000-0010-C7F0-E

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