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  Lock-in thermography for analyzing solar cells and failure analysis in other electronic components

Breitenstein, O., & Sturm, S. (2019). Lock-in thermography for analyzing solar cells and failure analysis in other electronic components. Quantitative InfraRed Thermography Journal, 16(3-4), 1-15. doi:10.1080/17686733.2018.1563349.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0009-0CE5-8 Version Permalink: https://hdl.handle.net/21.11116/0000-0009-442A-C
Genre: Journal Article

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2019
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https://doi.org/10.1080/17686733.2018.1563349 (Publisher version)
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 Creators:
Breitenstein, Otwin1, Author
Sturm, Steffen2, Author
Affiliations:
1Nano-Systems from Ions, Spins and Electrons, Max Planck Institute of Microstructure Physics, Max Planck Society, Weinberg 2, 06120 Halle, DE, ou_3287476              
2External Organizations, ou_persistent22              

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 Dates: 2019-02-222019
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: BibTex Citekey: P13766
DOI: 10.1080/17686733.2018.1563349
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Title: Quantitative InfraRed Thermography Journal
  Other : Quantitative infrared thermography journal
  Abbreviation : QIRT journal
Source Genre: Journal
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Publ. Info: Cachan Cedex : Lavoisier
Pages: - Volume / Issue: 16 (3-4) Sequence Number: - Start / End Page: 1 - 15 Identifier: ISSN: 1768-6733
CoNE: https://pure.mpg.de/cone/journals/resource/1768-6733