Combined low-temperature scanning tunneling/atomic force microscope for atomic 
resolution imaging and site-specific force spectroscopy

Albers, Boris; Liebmann, Marcus; Schwendemann, Todd C.; Baykara, Mehmet Z.; Heyde, Markus; Salmeron, Miquel; Altman, Eric I.; Schwarz, Udo D.

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Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy

Albers, B., Liebmann, M., Schwendemann, T. C., Baykara, M. Z., Heyde, M., Salmeron, M., et al. (2008). Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy. Review of Scientific Instruments, 79(3), 033704-1-033704-9. Retrieved from http://dx.doi.org/10.1063/1.2842631.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-FEFF-7 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-FF00-A

Genre: Journal Article

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Creators:
Albers, Boris, Author
Liebmann, Marcus, Author
Schwendemann, Todd C., Author
Baykara, Mehmet Z., Author
Heyde, Markus¹, Author
Salmeron, Miquel, Author
Altman, Eric I., Author
Schwarz, Udo D., Author

Affiliations:
1Chemical Physics, Fritz Haber Institute, Max Planck Society, ou_24022

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Language(s): eng - English

Dates: Date issued: 2008

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 402701
URI: http://dx.doi.org/10.1063/1.2842631

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Title: Review of Scientific Instruments

Alternative Title : Rev. Sci. Instrum.

Source Genre: Journal

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Pages: - Volume / Issue: 79 (3) Sequence Number: - Start / End Page: 033704-1 - 033704-9 Identifier: -