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Journal Article

VUV-ellipsometry on GaN: Probing conduction band properties by core level excitations

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Esser,  N.
Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Braun,  W.
Department Solid State Quantum Electronics (Jochen Mannhart), Max Planck Institute for Solid State Research, Max Planck Society;

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Cardona,  M.
Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Esser, N., Rakel, M., Cobet, C., Schmidt, W. G., Braun, W., & Cardona, M. (2005). VUV-ellipsometry on GaN: Probing conduction band properties by core level excitations. physica status solidi (b), 242(13), 2601-2609.


Cite as: https://hdl.handle.net/21.11116/0000-000E-FCA4-D
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